Analyte
Surface of solids, incl. powders
- Sample size : > 0,3 mm x 0,7 mm
- Sampling depth : <~ 7 nm
- Sensitivity : 0,02 - 0,5 at %
Equipment
Kratos Axis165
- X-ray sources: monochromatic Al anode, Al/Mg dual anode tube
- Magnetic lens
- Sampling area: normal: 300 µm x 700 µm; microspot: 120 µm, 60 µm, 30 µm
- Imaging by scanning of the electron optics (Chemical State Imaging), sensitivity 20 µm
- Variabele take-off angle
- Argon ion gun for sputter (depth profile)
Result
- Concentration of elements (except for hydrogen and helium) at the surface
- Binding states of the elements
- Lateral and vertical distribution of these data
Additional information
- Method description (PDF, german)
- Surface analytical techniques (PDF)
Contact
Dr. Andreas Holländer
Research devision
Functional Polymer Systems
phone +49 (0) 331/ 568-1404
fax +49 (0) 331/ 568-2504
email Andreas.Hollaender@iap.fraunhofer.de
Research devision
Functional Polymer Systems
phone +49 (0) 331/ 568-1404
fax +49 (0) 331/ 568-2504
email Andreas.Hollaender@iap.fraunhofer.de
Comparative and additional methods
- Fluorescence labelling
- Contact angle goniometry
- Secoundary ion mass spectrometry (SIMS)